Atomera Breathes New Life into Moore’s Law for Power and Analog Electronics
November 30, 2021
MST-SP Technology Provides Significant Cost Reduction for These Semiconductor Products
While digital chip technologies have benefitted greatly from Moore’s Law, there is a significant market for Bipolar CMOS-DMOS (BCD) semiconductors that are built today in legacy nodes ranging from 40nm to 180nm. According to The McClean Report from IC Insights, the major user of BCD processes is the Power Management ICs (PMICs) sector, which had a market size of
“I have worked in the analog and power device sector for a long time and have witnessed firsthand the challenges to scaling these devices compared to digital,” said
BCD technologies face more difficult scaling challenges than their digital counterparts and as a result have not seen the process node advances that digital chips have. While some market leaders have introduced advanced BCD processes at the 40nm nodes, most BCD devices are produced at older-generation process nodes. MST-SP enables BCD PMIC manufacturers to get up to 20% more die per wafer, enabling manufacturers to improve the profitability of existing fabs and/or improve the return on their investments in new processes and capacity.
“As PMICs continue to proliferate in everything that has a battery or a USB connector, the cost and area of the PMIC device is becoming a major challenge for OEMs,” said
The challenge limiting the ability to transition BCD power devices to smaller nodes has been sufficiently improving the on-resistance for a given breakdown voltage while ensuring reliability isn’t compromised. MST-SP provides two fundamental benefits. One is on-state mobility, or higher Idlin, and the second is an ability to control the doping with a degree of precision that is not possible with other approaches. The doping benefits also translate into improvements in the breakdown voltage as well as the overall ability to scale the gate length lower without losing breakdown voltage. The net effect is a 20% improvement in Idlin for a given VDS max, a key reliability parameter for the lifetime of the device.
The ability to scale the gate length while maintaining reliability also addresses the key challenge in moving BCD power devices to smaller nodes. By enabling a gate length shrink without compromising the reliability of the power device, manufacturers can take better advantage of a design rule shrink to reduce the overall device pitch. For 5V PMIC this enables up to 20% more die per wafer.
MST-SP is currently available to license for 5V power devices, which is the predominant operating voltage for BCD PMIC devices today. MST-SP can be customized to both higher- and lower-voltages by Atomera’s engineering team.
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